Product Overview

The ZYGO 7702 is a high-precision optical metrology system component developed by Zygo Corporation, a global leader in interferometry and surface metrology solutions. Known for its exceptional accuracy and stability, the ZYGO 7702 is widely used in industries such as semiconductor manufacturing, optics production, aerospace, and advanced materials research.

This model is part of Zygo’s well-regarded interferometer product line, designed to provide accurate, repeatable measurements of surface form, flatness, and wavefront quality. The ZYGO 7702 incorporates advanced optical engineering, delivering nanometer-level resolution essential for modern precision manufacturing.

Engineered for demanding environments, the ZYGO 7702 combines rugged mechanical construction with highly stable optics. It is optimized for integration into Zygo’s metrology systems, ensuring reliable operation in both laboratory and production settings. Its ability to provide real-time, non-contact measurements helps reduce process variability, increase yield, and improve overall quality control.

The ZYGO 7702 is trusted by engineers and researchers who require precise metrology solutions that support innovation and maintain the highest standards of manufacturing accuracy.

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Technical Specifications

Key Features and Benefits

The ZYGO 7702 offers unmatched performance in high-precision surface and wavefront metrology applications. Its design emphasizes stability, accuracy, and compatibility with cutting-edge manufacturing and research requirements.

A primary benefit of the ZYGO 7702 is its ability to achieve nanometer-level resolution, ensuring measurement precision that meets the most stringent standards in semiconductor fabrication and optics manufacturing. This accuracy enables users to detect minute deviations in flatness or surface form that could otherwise compromise product performance.

The optical design is highly stable, minimizing measurement noise and improving repeatability. This makes the ZYGO 7702 suitable for both laboratory research and in-line process monitoring in production environments. By providing fast, non-contact measurements, the system reduces inspection time while maintaining the integrity of delicate surfaces.

The component’s rugged construction ensures long-term reliability. Even under continuous use, the ZYGO 7702 maintains alignment and stability, lowering the need for frequent recalibration. Its compatibility with Zygo’s software platforms also provides advanced data analysis, intuitive visualization, and easy integration into broader quality control systems.

Ultimately, the ZYGO 7702 helps manufacturers and researchers achieve tighter tolerances, higher yields, and improved product performance—making it an essential tool for industries where precision is critical.

Related Models

• ZYGO 7701 – Predecessor model with foundational optical interferometry features.

• ZYGO 7703 – Upgraded version offering extended measurement range.

• ZYGO GPI XP – High-performance interferometer platform for general precision metrology.

• ZYGO Verifire – Advanced flatness measurement system for optical components.

• ZYGO NewView 8300 – 3D optical surface profiler for micro-roughness measurements.

• ZYGO 7720 – Variant optimized for semiconductor wafer metrology.

• ZYGO 7705 – Specialized model designed for high-resolution optics testing.

• ZYGO ZeGage Pro – Compact profiler for industrial surface texture measurements.